Advantest BGR-022365 A000824B-DED Test Interface Board

BGR-022365 with part code A000824B-DED is a high-precision signal processing board for Advantest semiconductor ATE test systems. It serves as core test interface unit, responsible for analog/digital signal generation, acquisition and conditioning for memory, SoC and chip performance testing. Multi-channel high-speed circuit design ensures ultra-stable signal output and measurement accuracy under high-frequency test conditions.

This discontinued original board is a critical maintenance spare for wafer fab and chip packaging test equipment. It adopts conformal coated PCB to resist dust and humidity in cleanrooms, standard rack slot installation, with onboard self-test circuit and edge connector for fast plug-and-play replacement without system full shutdown.

Main Specifications

• Brand: Advantest; Model: BGR-022365; Part No.: A000824B-DED; Series: BGR ATE Test Board Series
• Signal Channels: Multi-group analog & digital mixed test channels, DC to 2GHz wide frequency response
• Measurement Precision: ±0.05% full scale accuracy, microvolt-level low noise signal processing
• Backplane Interface: Standard large edge connector, high-speed parallel bus communication with test host
• Power Supply: 24VDC rack power input, built-in multi-stage filter circuit to suppress power ripple
• Environment: Operating 0℃ ~ +70℃, cleanroom compatible, anti-static industrial PCB design
• Diagnostics: Onboard self-test circuit, fault detection for channel short/open and communication loss
• Compatibility: Matches Advantest T2000 series memory & SOC automatic test platforms
• Certifications: CE, RoHS, semiconductor cleanroom industrial compliance certification

Core Functions

• Generate standard analog voltage/current excitation signals and capture chip feedback signals for semiconductor electrical parameter testing.
• High-frequency signal conditioning circuit eliminates test line crosstalk, guaranteeing consistent measurement data for chip yield inspection.
• Real-time bidirectional data transmission with ATE main controller, realizing synchronous multi-channel parallel chip batch testing.
• Integrated ESD protection circuit prevents electrostatic damage to test chips and internal board components in cleanroom production lines.
• Modular single-slot rack design allows independent board replacement, greatly shortening equipment downtime during chip production shift maintenance.
• Built-in signal calibration storage realizes one-time parameter calibration and long-term stable test repeatability without frequent recalibration.

Application Scenarios

• Test board spare replacement for Advantest T2000 ATE racks in semiconductor wafer fabrication and chip packaging factories.
• High-precision signal processing spare parts for memory chip, MCU and power IC electrical performance test stations.
• Maintenance backup inventory for electronics testing laboratories, semiconductor quality inspection and R&D prototype verification equipment.
• Matching test accessory paired with Advantest ATE mainframe, test probe cards and cleanroom test handler machines.
• Retrofit replacement components for aging semiconductor test equipment suffering signal drift, channel failure and test precision decline faults.

• Global aftermarket spare stock for semiconductor factory maintenance teams managing legacy Advantest automatic test equipment worldwide.