NI PXIe-4139 782856-02 Precision System Source Measure Unit
The NI PXIe-4139 (782856-02) is a high-performance single-slot PXI Express source measure unit (SMU) with four-quadrant operation. It integrates precision power sourcing and high-resolution measurement functions, supporting up to 40W DC power output, designed for semiconductor characterization and automated test systems.
This module delivers 100 fA current resolution and maximum 1.8 MS/s sampling rate, equipped with SourceAdapt technology to optimize transient response for various loads. It supports remote sensing and guard circuits to reduce measurement errors. Widely used for laboratory device research, production test equipment upgrade and spare parts stocking in semiconductor, electronics and optoelectronic industries.
Main Specifications
- Brand: National Instruments (NI)
- Model: PXIe-4139, Part No. 782856-02
- Bus Interface: PXI Express single-slot module
- Voltage Range: ±60 V maximum output
- Current: ±3 A DC continuous, ±10 A pulsed
- DC Power: 40W continuous, up to 500W pulsed power
- Measurement Resolution: 100 fA minimum current sensitivity
- Sampling Rate: Up to 1.8 MS/s simultaneous voltage & current acquisition
- Supported Function: 4-wire remote sense and guard terminal
- Operating Temperature: 0°C ~ +55°C
Core Functions
- Four-quadrant operation, capable of sourcing and sinking voltage and current
- Simultaneous precision measurement of output voltage and load current
- SourceAdapt technology for adaptive control loop tuning and stable load response
- Remote sense function compensates voltage ｄｒｏｐ on test wiring and fixtures
- Guard circuit suppresses leakage current for ultra-low current measurement
- Built-in comprehensive overvoltage, overcurrent and thermal protection
- Support IV curve sweeping, static bias and pulsed testing modes
- Programmable via NI MAX, LabVIEW and TestStand engineering software
- High-speed data streaming for dynamic device characteristic capture
- Modular architecture allows multi-channel synchronization in PXI chassis
Application Scenarios
- Power management IC (PMIC) and RFIC electrical characteristic testing
- LED, laser diode and optical transceiver optoelectronic device characterization
- MOSFET, diode and other discrete semiconductor component testing
- PCB board-level power consumption and leakage current measurement projects
- Semiconductor laboratory material and device research test platforms
- Automated production test equipment for consumer electronics modules
- Battery and supercapacitor charge-discharge characteristic analysis
- Medical electronic component reliability verification test systems
- NI PXI test system upgrading, expansion and spare parts replacement
- All industrial occasions requiring high-precision source-measure test instruments
